YG6500 X-ray fluorescence silicon aluminum analyzer

YG6500 X-ray fluorescence silicon aluminum analyzer

Performance characteristics of X-ray fluorescence silicon aluminum analyzer:

1. Microcomputerized integration, compact structure, and beautiful appearance.

2. Large screen LCD display, full Chinese menu prompt operation, extremely convenient to use.

3. The analysis time is short, and SiO2% and Al2O3% can be measured in one minute.

4. The instrument does not damage the sample during testing, and the sample can be reused.

5. No need for any chemical reagents, no emissions of three wastes, no radioactive sources, low power consumption, and in compliance with environmental and energy-saving requirements.

6. The data storage capacity is large, and the content results and instrument self inspection data can be queried, avoiding printing consumables.

7. The instrument shall comply with GB/T19140 "General Rules for X-ray Fluorescence Analysis of Cement".

8. It can be connected to the batching system for automatic control.

Technical indicators of X-ray fluorescence silicon aluminum analyzer:

1. Analysis range: SiO2, Al2O3 0.01%~100%

2. Analysis accuracy: standard deviation SSiO2 ≤ 0.10%, SAl2O3 ≤ 0.08%

3. Analysis width: SiO2 (Al2O3) max SiO2 (Al2O3) min ≤ 5%, for example, SiO2 in raw meal is 10%~15%, selected by calibrating the working curve.

4. Analysis time: n * 60 seconds (n is 1-5 natural numbers).

5. Usage conditions: Power supply AC200V~240V; Environmental temperature 0-40 ℃; Relative humidity<85% (30 ℃).

6. Overall power consumption:<30W

7. Overall size: 468mm * 368mm * 136mm

8. Overall weight: 13.8kg

Remarks: including a hydraulic Tablet press, a pair of pressing dies and 15 pressing rings.